IEC 60749-18 pdf download

IEC 60749-18 pdf download Semiconductor devices – Mechanical and climatic test methods – Part 18: Ionizing radiation (total dose)
1 Scope
This part of lEC 60749 provides a test procedure for defining requirements for testingpackaged semiconductor integrated circuits and discrete semiconductor devices for ionizingradiation (total dose) effects from a cobalt-60 (60co) gamma ray source.
This standard provides an accelerated annealing test for estimating low dose rate ionizingradiation effects on devices.This annealing test is important for low dose rate or certain otherapplications in which devices may exhibit significant time-dependent effects.
This standard addresses only steady-state irradiations,and is not applicable to pulse typeirradiations.
lt is intended for military- and space-related applications.
This standard may produce severe degradation of the electrical properties of irradiateddevices and thus should be considered a destructive test.
2 Terms and definitions
For the purposes of this part of lEC 60749, the following terms and definitions apply.
2.1
ionizing radiation effects
changes in the electrical parameters of a device or integrated circuit resulting from radiation-induced charge
NOTE These are also referred to as total dose effects.
2.2
in-flux test
electrical measurements made on devices during irradiation exposure
2.3
non in-flux test
electrical measurements made on devices at any time other than during irradiation
2.4
remote tests
electrical measurements made on devices that are physically removed from the radiationlocation
3 Test apparatus
The apparatus shall consist of the radiation source, electrical test instrumentation, test circuit board(s), cabling, interconnect board or switching system, an appropriate dosimetry measurement system, and an environmental chamber (if required for time-dependent effects measurements). Adequate precautions shall be observed to obtain an electrical measurement system with sufficient insulation, ample shielding, satisfactory grounding, and suitable low noise characteristics.
3.1 Radiation source The radiation source used in the test shall be the uniform field of a 60 Co gamma ray source. Uniformity of the radiation field in the volume where devices are irradiated shall be within ±1 0 % as measured by the dosimetry system, unless otherwise specified. The intensity of the gamma ray field of the 60 Co source shall be known with an uncertainty of no more than ±5 %. Field uniformity and intensity can be affected by changes in the location of the device with respect to the radiation source and the presence of radiation absorption and scattering materials.
3.2 Dosimetry system
An appropriate dosimetry system shall be provided that is capable of carrying out the measurements called for in 4.2.
3.3 Electrical test instruments
All instrumentation used for electrical measurements shall have the stability, accuracy, and resolution required for accurate measurement of the electrical parameters. Any instrument ation required to operate in a radiation environment shall be appropriately shielded.