IEC 60749-18 pdf download Semiconductor devices – Mechanical and climatic test methods – Part 18: Ionizing radiation (total dose) 1 Scope This part of lEC 60749 provides a test procedure for defining requirements for testingpackaged semiconductor integrated circuits and discrete semiconductor devices for ionizingradiation (total dose) effects from a cobalt-60 (60co) gamma ray source. This standard provides an accelerated annealing...